A Fault Diagnosis Method Based on Active Example Selection
- 期刊名称Journal of Circuits, Systems and Computers
- 作者Han, Zhiyan; Wang, Jian
- 卷第27卷
- 期第1期
- 印刷ISSN0218-1266
- 电子ISSN1793-6454
- 文件大小470.85KB
- 发表时间2018-01
- DOI10.1142/S0218126618500135
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