Remaining Useful Life Prognosis of Supercapacitors Under Temperature and Voltage Aging Conditions

• 期刊名称IEEE Transactions on Industrial Electronics
• 作者El Mejdoubi, Asmae; Chaoui, Hicham; Sabor, Jalal; Gualous, Hamid
• 卷第65卷
• 期第5期
• 印刷ISSN0278-0046
• 电子ISSN1557-9948
• 文件大小1482.45KB
• 发表时间2018-5
• DOI10.1109/TIE.2017.2767550
• 页码4357-4367