Uniaxial Strain Induced Critical Current Degradation of Ag-Sheathed Bi-2212 Round Wire
- 期刊名称IEEE Transactions on Applied Superconductivity
- 作者Dai, Chao; Qin, Jinggang; Liu, Bo; Liu, Peihang; Wu, Yu; Nijhuis, Arend; Zhou, Chao; Li, Chenshan; Hao, Qingbin; Liu, Sheng
- 卷第28卷
- 期第3期
- 印刷ISSN1051-8223
- 电子ISSN1558-2515
- 文件大小671.78KB
- 发表时间2018-4
- DOI10.1109/tasc.2017.2787133
- 页码1-4
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