Small Fault Detection for a Class of Closed-Loop Systems via Deterministic Learning

• 期刊名称IEEE Transactions on Cybernetics
• 作者Chen, Tianrui; Wang, Cong; Chen, Guo; Dong, Zhaoyang; Hill, David J.
• 印刷ISSN2168-2267
• 电子ISSN2168-2275
• 文件大小810.66KB
• 发表时间2018
• DOI10.1109/TCYB.2018.2789360
• 页码1-10