Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit
- 期刊名称IEEE Transactions on Circuits and Systems I: Regular Papers
- 作者Liu, Zhiqiang; Chaganti, Shravan K.; Chen, Degang
- 卷第65卷
- 期第5期
- 印刷ISSN1549-8328
- 电子ISSN1558-0806
- 文件大小1398.15KB
- 发表时间2018-5
- DOI10.1109/TCSI.2017.2751561
- 页码1664-1674
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