Particle Image Velocimetry || Applications: Micro PIV
Raffel, Markus; Willert, Christian E.; Scarano, Fulvio; Kähler, Christian J.; Wereley, Steve T.; Kompenhans, Jürgen
- 作者Raffel, Markus; Willert, Christian E.; Scarano, Fulvio; Kähler, Christian J.; Wereley, Steve T.; Kompenhans, Jürgen
- 文件大小2453.94KB
- 发表时间2018
- DOI10.1007/978-3-319-68852-7_16
- 页码547-584