Particle Image Velocimetry || Related Techniques
Raffel, Markus; Willert, Christian E.; Scarano, Fulvio; Kähler, Christian J.; Wereley, Steve T.; Kompenhans, Jürgen
- 作者Raffel, Markus; Willert, Christian E.; Scarano, Fulvio; Kähler, Christian J.; Wereley, Steve T.; Kompenhans, Jürgen
- 文件大小1061.06KB
- 发表时间2018
- DOI10.1007/978-3-319-68852-7_19
- 页码633-649