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On entropy goodness-of-fit test based on integrated distribution function

On entropy goodness-of-fit test based on integrated distribution function

Lee, Sangyeol; Park, Siyun; Kim, Byungsoo
  • 期刊名称Journal of Statistical Computation and Simulation
  • 作者Lee, Sangyeol; Park, Siyun; Kim, Byungsoo
  • 印刷ISSN0094-9655
  • 电子ISSN1563-5163
  • 文件大小1544.26KB
  • 发表时间2018-04-26
  • DOI10.1080/00949655.2018.1467911
  • 页码1-15
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