On entropy goodness-of-fit test based on integrated distribution function
Lee, Sangyeol; Park, Siyun; Kim, Byungsoo
- 期刊名称Journal of Statistical Computation and Simulation
- 作者Lee, Sangyeol; Park, Siyun; Kim, Byungsoo
- 印刷ISSN0094-9655
- 电子ISSN1563-5163
- 文件大小1544.26KB
- 发表时间2018-04-26
- DOI10.1080/00949655.2018.1467911
- 页码1-15