Application of digital shearing speckle pattern interferometry for thermal stress
Wang, X.; Gao, Z.; Yang, S.; Gao, C.; Sun, X.; Wen, X.; Feng, Z.; Wang, S.; Fan, Y.
- 期刊名称Measurement
- 作者Wang, X.; Gao, Z.; Yang, S.; Gao, C.; Sun, X.; Wen, X.; Feng, Z.; Wang, S.; Fan, Y.
- 卷第125卷
- 印刷ISSN0263-2241
- 文件大小3617.20KB
- 发表时间2018-09
- DOI10.1016/j.measurement.2018.04.073
- 页码11-18