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[IEEE 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, TX, USA (2018.3.4-2018.3.8)] 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - An improved analysis of dv/dt-induced low-side MOSFET false turn on in synchronous Buck converters

[IEEE 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, TX, USA (2018.3.4-2018.3.8)] 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - An improved analysis of dv/dt-induced low-side MOSFET false turn on in synchronous Buck converters

Li, Ruqi; Zhu, Joyce; Xie, Manjing

作者Li, Ruqi; Zhu, Joyce; Xie, Manjing
文件大小1506.33KB
发表时间2018
DOI10.1109/APEC.2018.8341326
页码2227-2234

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