[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Concurrent Sampling with Local Digitization — An Alternative to Analog Test Bus
Liu, Nanqi; Chaganti, Shravan K.; Liu, Zhiqiang; Chen, Degang; Majumdar, Amitava
- 作者Liu, Nanqi; Chaganti, Shravan K.; Liu, Zhiqiang; Chen, Degang; Majumdar, Amitava
- 文件大小1231.50KB
- 发表时间2018
- DOI10.1109/ISCAS.2018.8351555
- 页码1-5