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Influence of High-Temperature Annealing of the Textured Metal Ni–W Substrate on the Structural Properties of Seed Layer in HTS 2G tapes

Influence of High-Temperature Annealing of the Textured Metal Ni–W Substrate on the Structural Properties of Seed Layer in HTS 2G tapes

Chernykh, M. Y.; Krylova, T. S.; Kulikov, I. V.; Chernykh, I. A.; Zanaveskin, M. L.
  • 期刊名称Physics of Metals and Metallography
  • 作者Chernykh, M. Y.; Krylova, T. S.; Kulikov, I. V.; Chernykh, I. A.; Zanaveskin, M. L.
  • 卷第119卷
  • 期第3期
  • 印刷ISSN0031-918X
  • 电子ISSN1555-6190
  • 文件大小515.00KB
  • 发表时间2018-3
  • DOI10.1134/S0031918X1803002X
  • 页码267-271
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