Capacitance Measurements in Vertical III-V Nanowire TFETs
- 期刊名称IEEE Electron Device Letters
- 作者Hellenbrand, Markus; Memisevic, Elvedin; Svensson, Johannes; Krishnaraja, Abinaya; Lind, Erik; Wernersson, Lars-Erik
- 印刷ISSN0741-3106
- 电子ISSN1558-0563
- 文件大小609.76KB
- 发表时间2018
- DOI10.1109/LED.2018.2833168
- 页码1-1
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