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[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - On IC traceability via blockchain

[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - On IC traceability via blockchain

Islam, Md Nazmul; Patii, Vinay C; Kundu, Sandip

作者Islam, Md Nazmul; Patii, Vinay C; Kundu, Sandip
文件大小595.55KB
发表时间2018
DOI10.1109/VLSI-DAT.2018.8373269
页码1-4

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