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[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Using approximate circuits to counter process imperfections in CNFET based circuits

[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Using approximate circuits to counter process imperfections in CNFET based circuits

Sheikh, Kaship; Wei, Lan

作者Sheikh, Kaship; Wei, Lan
文件大小641.50KB
发表时间2018
DOI10.1109/VLSI-DAT.2018.8373267
页码1-4

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