[Lecture Notes in Electrical Engineering] Advanced Computational and Communication Paradigms Volume 475 || Statistical Viability Analysis and Optimization Through Gate Sizing
Bhattacharyya, Siddhartha; Gandhi, Tapan; Sharma, Kalpana; Dutta, Paramartha
- 作者Bhattacharyya, Siddhartha; Gandhi, Tapan; Sharma, Kalpana; Dutta, Paramartha
- 文件大小315.04KB
- 发表时间2018
- DOI10.1007/978-981-10-8240-5_17
- 页码149-155