[IEEE 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Austin, TX, USA (2018.3.19-2018.3.22)] 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Addressable test structure design enabling parallel testing of reliability devices
DeBruler, Lee; Pretti, Dennis; Violette, Mike; Peterson, Dave; Mujumdar, Salil; Li, Xia; Marr, Ken
- 作者DeBruler, Lee; Pretti, Dennis; Violette, Mike; Peterson, Dave; Mujumdar, Salil; Li, Xia; Marr, Ken
- 文件大小661.92KB
- 发表时间2018
- DOI10.1109/ICMTS.2018.8383783
- 页码137-141