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[ACM Press the 2018 - Chicago, IL, USA (2018.05.23-2018.05.25)] Proceedings of the 2018 on Great Lakes Symposium on VLSI - GLSVLSI '18 - Methodology to Capture Statistical Effect of Process Imperfections on Glitch Suppression in CNFET Circuits and to Improve by Using Approximate Circuits

[ACM Press the 2018 - Chicago, IL, USA (2018.05.23-2018.05.25)] Proceedings of the 2018 on Great Lakes Symposium on VLSI - GLSVLSI '18 - Methodology to Capture Statistical Effect of Process Imperfections on Glitch Suppression in CNFET Circuits and to Improve by Using Approximate Circuits

Sheikh, Kaship; Wei, Lan

作者Sheikh, Kaship; Wei, Lan
文件大小1822.93KB
发表时间2018
DOI10.1145/3194554.3194587
页码27-32

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