[IEEE 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - ROMA, Italy (2018.5.22-2018.5.25)] 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Automated reduced order model generation for MEMS
Kriebel, David; Schmidt, Henry; Freitag, Markus; Mehner, Jan E.
- 作者Kriebel, David; Schmidt, Henry; Freitag, Markus; Mehner, Jan E.
- 文件大小1976.01KB
- 发表时间2018
- DOI10.1109/dtip.2018.8394226
- 页码1-6