Investigations of the impact of initial stresses on fracture and delamination risks of an avionics MEMS pressure sensor
Auersperg, J.; Auerswald, E.; Collet, C.; Dean, Th.; Vogel, D.; Winkler, Th.; Rzepka, S.
- 期刊名称Microelectronics Reliability
- 作者Auersperg, J.; Auerswald, E.; Collet, C.; Dean, Th.; Vogel, D.; Winkler, Th.; Rzepka, S.
- 卷第87卷
- 印刷ISSN0026-2714
- 文件大小2597.27KB
- 发表时间2018-08
- DOI10.1016/j.microrel.2018.06.019
- 页码238-244