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Investigations of the impact of initial stresses on fracture and delamination risks of an avionics MEMS pressure sensor

Investigations of the impact of initial stresses on fracture and delamination risks of an avionics MEMS pressure sensor

Auersperg, J.; Auerswald, E.; Collet, C.; Dean, Th.; Vogel, D.; Winkler, Th.; Rzepka, S.
  • 期刊名称Microelectronics Reliability
  • 作者Auersperg, J.; Auerswald, E.; Collet, C.; Dean, Th.; Vogel, D.; Winkler, Th.; Rzepka, S.
  • 卷第87卷
  • 印刷ISSN0026-2714
  • 文件大小2597.27KB
  • 发表时间2018-08
  • DOI10.1016/j.microrel.2018.06.019
  • 页码238-244
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