Investigation of Si Dendrites by Electron-Beam-Induced Current
- 期刊名称Crystals
- 作者Yi, Wei; Chen, Jun; Ito, Shun; Nakazato, Koji; Kimura, Takashi; Sekiguchi, Takashi; Fujiwara, Kozo
- 卷第8卷
- 期第8期
- 电子ISSN2073-4352
- 文件大小5582.27KB
- 发表时间2018-08-07
- DOI10.3390/cryst8080317
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