A novel approach to surface defect detection
Da, Yihui; Dong, Guirong; Wang, Bin; Liu, Dianzi; Qian, Zhenghua
- 期刊名称International Journal of Engineering Science
- 作者Da, Yihui; Dong, Guirong; Wang, Bin; Liu, Dianzi; Qian, Zhenghua
- 卷第133卷
- 印刷ISSN0020-7225
- 文件大小1289.11KB
- 发表时间2018-12
- DOI10.1016/j.ijengsci.2018.09.005
- 页码181-195