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Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films

Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films

Letz, S.A.; Farooghian, A.; Simon, F.B.; Schletz, A.

期刊名称Microelectronics Reliability
作者Letz, S.A.; Farooghian, A.; Simon, F.B.; Schletz, A.
印刷ISSN0026-2714
文件大小1123.70KB
发表时间2018-09
DOI10.1016/j.microrel.2018.07.084
页码1113-1117

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