A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Laflamme-Mayer, Nicolas; Kowarzyk, Gilbert; Blaquiere, Yves; Savaria, Yvon; Sawan, Mohamad
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小2906.32KB
- 发表时间2018
- DOI10.1109/TVLSI.2018.2876458
- 页码1-12
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