Using MRED to Screen Multiple Node Charge Collection Mitigated SOI Layouts
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Black, Jeffrey D.; Dame, Jeff A.; Black, Dolores A.; Dodd, Paul E.; Shaneyfelt, Marty R.; Teifel, John; Salas, Joseph G.; Steinbach, Robert; Davis, Matthew; Reed, Robert A.; Weller, Robert A.; Trippe, James M.; Warren, Kevin M.; Tonigan, Andrew M.; Schrimpf, Ronald D.; Marquez, Richard S.
- 印刷ISSN0018-9499
- 电子ISSN1558-1578
- 文件大小509.64KB
- 发表时间2018
- DOI10.1109/TNS.2018.2882944
- 页码1-1
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