Deep Learning of Complex Batch Process Data and Its Application on Quality Prediction
- 期刊名称IEEE Transactions on Industrial Informatics
- 作者Wang, Kai; Gopaluni, Bhushan; Chen, Junghui; Song, Zhihuan
- 印刷ISSN1551-3203
- 电子ISSN1941-0050
- 文件大小1102.15KB
- 发表时间2018
- DOI10.1109/TII.2018.2880968
- 页码1-1
Electronic-Frequency-Tuning MagnetronObata, Hideyuki; Tsuji, Naoki; Furumoto, Kuniyoshi · IEEE Transactions on Electron Devices · 2012
Potential device applications using photorefractive materialsDube, R.R. · IEEE Transactions on Electron Devices · 1989
GigatronMcIntyre, P.M.; Bizek, H.M.; Elliott, S.M.; Nassiri, A.; Popovic, M.B.; Raparia, D.; Swenson, C.A.; Gray, H.F. · IEEE Transactions on Electron Devices · 1989
Complementary Magnetic Tunnel Junction LogicFriedman, Joseph S.; Sahakian, Alan V. · IEEE Transactions on Electron Devices · 2014
Periodically Allocated Reentrant Cavity KlystronPaoloni, Claudio · IEEE Transactions on Electron Devices · 2014
A theory of multiplication noiseHollenhorst, J.N. · IEEE Transactions on Electron Devices · 1990
Table of contentsIEEE Transactions on Electron Devices · 2014
2014 IEEE CSICS Short CoursesIEEE Transactions on Electron Devices · 2014