Turn-off Transient Analysis of Superjunction IGBT
Wang, Zhigang; Zhang, Hao; Kuo, James B.
- 期刊名称IEEE Transactions on Electron Devices
- 作者Wang, Zhigang; Zhang, Hao; Kuo, James B.
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小1844.60KB
- 发表时间2018
- DOI10.1109/TED.2018.2884020
- 页码1-8