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[IEEE 2018 31st Symposium on Integrated Circuits and Systems Design (SBCCI) - Bento Goncalves (2018.8.27-2018.8.31)] 2018 31st Symposium on Integrated Circuits and Systems Design (SBCCI) - Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp

[IEEE 2018 31st Symposium on Integrated Circuits and Systems Design (SBCCI) - Bento Goncalves (2018.8.27-2018.8.31)] 2018 31st Symposium on Integrated Circuits and Systems Design (SBCCI) - Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp

Fontana, A.; Pazos, S. M.; Aguirre, F. L.; Palumbo, F.; Vega, N.; Muller, N. A.; de la Fourniere, E.; Debray, M.
  • 作者Fontana, A.; Pazos, S. M.; Aguirre, F. L.; Palumbo, F.; Vega, N.; Muller, N. A.; de la Fourniere, E.; Debray, M.
  • 文件大小7.87KB
  • 发表时间2018
  • DOI10.1109/SBCCI.2018.8533232
  • 页码1-5
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