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Performance Degradation of GaN HEMTs Under Accelerated Power Cycling Tests

Performance Degradation of GaN HEMTs Under Accelerated Power Cycling Tests

Xu, Chi; Yang, Fei; Ugur, Enes; Pu, Shi; Akin, Bilal
  • 期刊名称CPSS Transactions on Power Electronics and Applications
  • 作者Xu, Chi; Yang, Fei; Ugur, Enes; Pu, Shi; Akin, Bilal
  • 卷第3卷
  • 期第4期
  • 印刷ISSN2475-742X
  • 文件大小4097.15KB
  • 发表时间2018-12
  • DOI10.24295/CPSSTPEA.2018.00027
  • 页码269-277
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