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Determination of precise crystallographic directions on Si{111} wafers using self-aligning pre-etched pattern

Determination of precise crystallographic directions on Si{111} wafers using self-aligning pre-etched pattern

Narasimha Rao, Avvaru Venkata; Swarnalatha, Veerla; Pandey, Ashok Kumar; Pal, Prem
  • 期刊名称Micro and Nano Systems Letters
  • 作者Narasimha Rao, Avvaru Venkata; Swarnalatha, Veerla; Pandey, Ashok Kumar; Pal, Prem
  • 卷第6卷
  • 期第1期
  • 电子ISSN2213-9621
  • 文件大小2462.00KB
  • 发表时间2018-12
  • DOI10.1186/s40486-018-0066-1
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