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[IEEE 2018 IEEE Frontiers in Education Conference (FIE) - San Jose, CA, USA (2018.10.3-2018.10.6)] 2018 IEEE Frontiers in Education Conference (FIE) - Measuring Curricular Impact using an ABET-based Engineering Self-Efficacy Scale

[IEEE 2018 IEEE Frontiers in Education Conference (FIE) - San Jose, CA, USA (2018.10.3-2018.10.6)] 2018 IEEE Frontiers in Education Conference (FIE) - Measuring Curricular Impact using an ABET-based Engineering Self-Efficacy Scale

Schar, Mark; Brackin, Patsy; Chew, K. J.; Sheppard, Sheri

作者Schar, Mark; Brackin, Patsy; Chew, K. J.; Sheppard, Sheri
文件大小143.04KB
发表时间2018
DOI10.1109/FIE.2018.8658658
页码1-7

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