P5776Burden of device-detected atrial high-rate episode is associated with heart failure events
Nishinarita, R; Niwano, S; Fukaya, H; Oikawa, J; Nabeta, T; Arakawa, Y; Horiguchi, A; Nakamura, H; Kishihara, J; Sato, A; Niwano, H; Ako, J
- 期刊名称European Heart Journal
- 作者Nishinarita, R; Niwano, S; Fukaya, H; Oikawa, J; Nabeta, T; Arakawa, Y; Horiguchi, A; Nakamura, H; Kishihara, J; Sato, A; Niwano, H; Ako, J
- 卷第39卷
- 印刷ISSN0195-668X
- 电子ISSN1522-9645
- 文件大小519.14KB
- 发表时间2018-08-01
- DOI10.1093/eurheartj/ehy566.P5776