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[IEEE 2018 IEEE 13th International Conference on Industrial and Information Systems (ICIIS) - Rupnagar, India (2018.12.1-2018.12.2)] 2018 IEEE 13th International Conference on Industrial and Information Systems (ICIIS) - Local pattern-based descriptors for iris recognition: A comparative analysis

[IEEE 2018 IEEE 13th International Conference on Industrial and Information Systems (ICIIS) - Rupnagar, India (2018.12.1-2018.12.2)] 2018 IEEE 13th International Conference on Industrial and Information Systems (ICIIS) - Local pattern-based descriptors for iris recognition: A comparative analysis

Vyas, Ritesh; Kanumuri, Tirupathiraju; Sheoran, Gyanendra; Kumari, Vineeta
  • 作者Vyas, Ritesh; Kanumuri, Tirupathiraju; Sheoran, Gyanendra; Kumari, Vineeta
  • 文件大小743.89KB
  • 发表时间2018
  • DOI10.1109/ICIINFS.2018.8721368
  • 页码36-41
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