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AIP Conference Proceedings [Author(s) MATERIALS CHARACTERIZATION USING X-RAYS AND RELATED TECHNIQUES - Kelantan, Malaysia (18–19 August 2018)] - Effect of RF power on structural, morphological and optical properties of NiO thin films

AIP Conference Proceedings [Author(s) MATERIALS CHARACTERIZATION USING X-RAYS AND RELATED TECHNIQUES - Kelantan, Malaysia (18–19 August 2018)] - Effect of RF power on structural, morphological and optical properties of NiO thin films

Ahmed, Anas A.; Hashim, M. R.; Rashid, Marzaini

作者Ahmed, Anas A.; Hashim, M. R.; Rashid, Marzaini
卷第2068卷
印刷ISSN0094-243X
文件大小1656.89KB
发表时间2019
DOI10.1063/1.5089375

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