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High-throughput process chain for single electron transistor devices based on field-emission scanning probe lithography and Smart Nanoimprint lithography technology

High-throughput process chain for single electron transistor devices based on field-emission scanning probe lithography and Smart Nanoimprint lithography technology

Lenk, Claudia; Krivoshapkina, Yana; Hofmann, Martin; Lenk, Steve; Ivanov, Tzvetan; Rangelow, Ivo W.; Ahmad, Ahmad; Reum, Alexander; Holz, Mathias; Glinsner, Thomas; Eibelhuber, Martin; Treiblmayr, Dominik; Schamberger, Barbara; Chouiki, Mustapha; Chan, Boon Teik; el Otell, Ziad; de Marneffe, Jean-François
  • 期刊名称Journal of Vacuum Science & Technology B
  • 作者Lenk, Claudia; Krivoshapkina, Yana; Hofmann, Martin; Lenk, Steve; Ivanov, Tzvetan; Rangelow, Ivo W.; Ahmad, Ahmad; Reum, Alexander; Holz, Mathias; Glinsner, Thomas; Eibelhuber, Martin; Treiblmayr, Dominik; Schamberger, Barbara; Chouiki, Mustapha; Chan, Boon Teik; el Otell, Ziad; de Marneffe, Jean-François
  • 卷第37卷
  • 期第2期
  • 印刷ISSN2166-2746
  • 电子ISSN2166-2754
  • 文件大小5826.70KB
  • 发表时间2019-03
  • DOI10.1116/1.5067269
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