High-throughput process chain for single electron transistor devices based on field-emission scanning probe lithography and Smart Nanoimprint lithography technology
Lenk, Claudia; Krivoshapkina, Yana; Hofmann, Martin; Lenk, Steve; Ivanov, Tzvetan; Rangelow, Ivo W.; Ahmad, Ahmad; Reum, Alexander; Holz, Mathias; Glinsner, Thomas; Eibelhuber, Martin; Treiblmayr, Dominik; Schamberger, Barbara; Chouiki, Mustapha; Chan, Boon Teik; el Otell, Ziad; de Marneffe, Jean-François
- 期刊名称Journal of Vacuum Science & Technology B
- 作者Lenk, Claudia; Krivoshapkina, Yana; Hofmann, Martin; Lenk, Steve; Ivanov, Tzvetan; Rangelow, Ivo W.; Ahmad, Ahmad; Reum, Alexander; Holz, Mathias; Glinsner, Thomas; Eibelhuber, Martin; Treiblmayr, Dominik; Schamberger, Barbara; Chouiki, Mustapha; Chan, Boon Teik; el Otell, Ziad; de Marneffe, Jean-François
- 卷第37卷
- 期第2期
- 印刷ISSN2166-2746
- 电子ISSN2166-2754
- 文件大小5826.70KB
- 发表时间2019-03
- DOI10.1116/1.5067269