Degradation mechanism of blue thermally activated delayed fluorescent organic light-emitting diodes under electrical stress
Sohn, Jiho; Ko, Donghyun; Lee, Hyunho; Han, Jongseok; Lee, Sin-Doo; Lee, Changhee
- 期刊名称Organic Electronics
- 作者Sohn, Jiho; Ko, Donghyun; Lee, Hyunho; Han, Jongseok; Lee, Sin-Doo; Lee, Changhee
- 印刷ISSN1566-1199
- 文件大小2562.88KB
- 发表时间2019-4
- DOI10.1016/j.orgel.2019.04.033