Modelling atomic-scale electrical contact quality across two-dimensional interfaces

Song, Aisheng; Shi, Ruoyu; Lu, Hongliang; Gao, Lei; Li, Qunyang; Guo, Hui; Liu, Yanmin; Zhang, Jie; Ma, Yuan; Tang, Xin; Du, Shixuan; Li, Xin; Liu, Xiao; Hu, Yuanzhong; Gao, Hongjun; Luo, Jianbin; Ma, Tianbao

期刊名称Nano Letters
作者Song, Aisheng; Shi, Ruoyu; Lu, Hongliang; Gao, Lei; Li, Qunyang; Guo, Hui; Liu, Yanmin; Zhang, Jie; Ma, Yuan; Tang, Xin; Du, Shixuan; Li, Xin; Liu, Xiao; Hu, Yuanzhong; Gao, Hongjun; Luo, Jianbin; Ma, Tianbao
印刷ISSN1530-6984
电子ISSN1530-6992
文件大小3930.29KB
发表时间2019-05-15
DOI10.1021/acs.nanolett.9b00695

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Modelling atomic-scale electrical contact quality across two-dimensional interfaces