Fluctuations of focused electron beam in a conventional SEM
Knápek, Alexandr; Šikula, Josef; Bartlová, Milada
- 期刊名称Ultramicroscopy
- 作者Knápek, Alexandr; Šikula, Josef; Bartlová, Milada
- 印刷ISSN0304-3991
- 文件大小972.70KB
- 发表时间2019-5
- DOI10.1016/j.ultramic.2019.05.008