Global Analysis of Influence of Contacts on Heusler-Based Thermoelectric Modules

Roy, G.; Van Der Rest, C.; Heymans, S.; Quintin, E.; Dupont, V.; Erauw, J. P.; Schmitz, A.; Jacques, P. J.

期刊名称Journal of Electronic Materials
作者Roy, G.; Van Der Rest, C.; Heymans, S.; Quintin, E.; Dupont, V.; Erauw, J. P.; Schmitz, A.; Jacques, P. J.
印刷ISSN0361-5235
电子ISSN1543-186X
文件大小2593.82KB
发表时间2019-4-1
DOI10.1007/s11664-019-07137-2

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