A Ferroelectric FET based Processing-in-Memory Architecture for DNN Acceleration

Long, Yun; Kim, Daehyun; Lee, Edward; Saha, Priyabrata; Mudassar, Burhan Ahmad; She, Xueyuan; Khan, Asif Islam; Mukhopadhyay, Saibal

期刊名称IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
作者Long, Yun; Kim, Daehyun; Lee, Edward; Saha, Priyabrata; Mudassar, Burhan Ahmad; She, Xueyuan; Khan, Asif Islam; Mukhopadhyay, Saibal
电子ISSN2329-9231
文件大小689.92KB
发表时间2019
DOI10.1109/JXCDC.2019.2923745
页码1-1

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