发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

An Equivalent-Effect Phenomenon in Eddy Current Non-Destructive Testing of Thin Structures

An Equivalent-Effect Phenomenon in Eddy Current Non-Destructive Testing of Thin Structures

Yin, Wuliang; Tang, Jiawei; Lu, Mingyang; Xu, Hanyang; Huang, Ruochen; Zhao, Qian; Zhang, Zhijie; Peyton, Anthony
  • 期刊名称IEEE Access
  • 作者Yin, Wuliang; Tang, Jiawei; Lu, Mingyang; Xu, Hanyang; Huang, Ruochen; Zhao, Qian; Zhang, Zhijie; Peyton, Anthony
  • 卷第7卷
  • 电子ISSN2169-3536
  • 文件大小48.04KB
  • 发表时间2019
  • DOI10.1109/ACCESS.2019.2916980
  • 页码70296-70307
← 返回【学霸图书馆】主页