[IEEE 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Shanghai, China (2019.5.19-2019.5.23)] 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Performance and Reliability Co-design of LDMOS-SCR for Self-Protected High Voltage Applications On-Chip
Kranthi, Nagothu Karmel; Kumar, B. Sampath; Salman, Akram; Boselli, Gianluca; Shrivastava, Mayank
- 作者Kranthi, Nagothu Karmel; Kumar, B. Sampath; Salman, Akram; Boselli, Gianluca; Shrivastava, Mayank
- 文件大小1109.45KB
- 发表时间2019
- DOI10.1109/ISPSD.2019.8757641
- 页码407-410