[IEEE 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - Detroit, MI, USA (2019.6.19-2019.6.21)] 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - SiC MOSFET Aging Detection Based on Miller Plateau Voltage Sensing
- 作者Pu, Shi; Yang, Fei; Ugur, Enes; Xu, Chi; Akin, Bilal
- 文件大小1076.39KB
- 发表时间2019
- DOI10.1109/ITEC.2019.8790553
- 页码1-6
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