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Toward a Unified Theory Correlating Electronic, Thermodynamic and Mechanical Properties at Defective Al/SiO2 Nanodevice Interface: an Application to Dielectric Breakdown

Toward a Unified Theory Correlating Electronic, Thermodynamic and Mechanical Properties at Defective Al/SiO2 Nanodevice Interface: an Application to Dielectric Breakdown

Huang, Jianqiu; Lin, Fei; Hin, Celine

期刊名称ACS Applied Nano Materials
作者Huang, Jianqiu; Lin, Fei; Hin, Celine
印刷ISSN2574-0970
电子ISSN2574-0970
文件大小34336.08KB
发表时间2019-10-10
DOI10.1021/acsanm.9b01281

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