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[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Testing of In-Memory-Computing 8T SRAMs

[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Testing of In-Memory-Computing 8T SRAMs

Tsai, Tsai-Ling; Li, Jin-Fu; Hsu, Chun-Lung; Sun, Chi-Tien
  • 作者Tsai, Tsai-Ling; Li, Jin-Fu; Hsu, Chun-Lung; Sun, Chi-Tien
  • 文件大小93.88KB
  • 发表时间2019
  • DOI10.1109/DFT.2019.8875487
  • 页码1-4
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