[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - High Performance Memory Repair
Merchant, Feroze; Devarajan, Anandraj; Basu, Anik; Ashen, Dave; Yelton, Brandon; Joshi, Prashant D.
- 作者Merchant, Feroze; Devarajan, Anandraj; Basu, Anik; Ashen, Dave; Yelton, Brandon; Joshi, Prashant D.
- 文件大小344.11KB
- 发表时间2019
- DOI10.1109/DFT.2019.8875490
- 页码1-4