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[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Predicting Single Event Effects in DRAM

[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Predicting Single Event Effects in DRAM

Kline, Donald; Longofono, Stephen; Melhem, Rami; Jones, Alex K.
  • 作者Kline, Donald; Longofono, Stephen; Melhem, Rami; Jones, Alex K.
  • 文件大小5259.95KB
  • 发表时间2019
  • DOI10.1109/DFT.2019.8875328
  • 页码1-6
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