发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Modelling of ΔV
<sub/>T</sub>
in NBT Stressed P-Channel Power VDMOSFETs

[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Modelling of ΔV _T in NBT Stressed P-Channel Power VDMOSFETs

Mitrovic, N.; Dankovic, D.; Prijic, Z.; Stojadinovic, N.

作者Mitrovic, N.; Dankovic, D.; Prijic, Z.; Stojadinovic, N.
文件大小804.13KB
发表时间2019
DOI10.1109/MIEL.2019.8889584
页码177-180

← 返回【学霸图书馆】主页