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[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Co-relation Scan Attack Analysis (COSAA) on AES: A Comprehensive Approach

[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Co-relation Scan Attack Analysis (COSAA) on AES: A Comprehensive Approach

文件大小327.66KB
发表时间2019
DOI10.1109/dft.2019.8875272
页码1-6

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