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[IEEE 2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) - Chengdu, China (2019.8.23-2019.8.25)] 2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) - A Scan-Chain Circuit Design for BRAM Test Based on CLB

[IEEE 2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) - Chengdu, China (2019.8.23-2019.8.25)] 2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) - A Scan-Chain Circuit Design for BRAM Test Based on CLB

He, Wang; Dayu, Zhang; Faming, Yang; Yue, Wang; Song, Zhang; Yanchao, Yang

作者He, Wang; Dayu, Zhang; Faming, Yang; Yue, Wang; Song, Zhang; Yanchao, Yang
文件大小3440.72KB
发表时间2019
DOI10.1109/iccsd.2019.8842933
页码55-58

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